Transmission electron microscopy is a technique in which a beam of electronsis transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid.
JEOL JEM-3000F FEGTEM
JEOL ARM-200F
- Cold field emission source (CFEG) Cs probe corrected 200kV TEM (STEM)
- High resolution analytical TEM with Cs probe, featuring 100mm2 Centurion EDX detector and Gatan GIF Quantum 965 ER featuring Dual EELS and EFTEM capabilities
